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Other articles related with "leakage current density"：
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127703 |
Lin Zhou(周琳), Lu Liu(刘璐), Yu-Heng Deng(邓煜恒), Chun-Xia Li(李春霞), Jing-Ping Xu(徐静平) |
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Improved interfacial properties of HfGdON gate dielectric Ge MOS capacitor by optimizing Gd content |
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Chin. Phys. B
2019 Vol.28 (12): 127703-127703
[Abstract]
(447)
[HTML 1 KB]
[PDF 1950 KB]
(114)
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